2. Fault localization with field sources The functional fault is often caused by magnetic fields of the disturbance current or by electric fields (inductive coupling). In order to pinpoint the place of interference, these fields are now injected with field sources which generate a magnetic or electric field in a small space. If a functional fault occurs when conducted disturbance current flows into and out of the EUT, magnetic field sources are used for fault localization. E field sources are used in the event that the fault occurs during inductive coupling.

Exhibitor
Langer EMV-Technik GmbH