IC Scanner 4-Axis Positioning System with High-Resolution Near-Field Measurement
Exhibitor
Langer EMV-Technik GmbH
The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field's direction.
Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder.
The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.
ICS 105: High-Resolution Near-Field Measurements with ICR Microprobes and ChipScan-Scanner Software - Perform precise measurements with ICR near-field microprobes, achieving resolutions of 50 to 100 µm. Mount various sizes of circuit boards on the UH-DUT universal holder and automate your testing with ChipScan-Scanner software for fast and accurate evaluation.
ICS 105: High-Resolution Near-Field Measurements with ICR Microprobes and ChipScan-Scanner Software - Perform precise measurements with ICR near-field microprobes, achieving resolutions of 50 to 100 µm. Mount various sizes of circuit boards on the UH-DUT universal holder and automate your testing with ChipScan-Scanner software for fast and accurate evaluation.
ICS 105: Versatile Near-Field Measurements with ChipScan-Scanner Software and UH-DUT Holder - Mount various sizes of circuit boards on the UH-DUT universal holder for precise measurements with the ICR near-field microprobe. Automate and visualize electric and magnetic field measurements with ChipScan-Scanner software for fast and accurate evaluation.
