CES - Consumer Electronics Show 2025Products & Services ESA1 Emission Development System Handy test station Interference emission for the developer's workplace

ESA1 Emission Development System Handy test station Interference emission for the developer's workplace

Exhibitor
Langer EMV-Technik GmbH

The ESA1 is a system of EMC tools for measuring the interference of assemblies and devices. The CS-ESA software allows the developer to quickly and comprehensively suppress interference affecting the DUT. Interference measurements taken during the development stage with ESA1 are proportional to the results from far-field measurements or from measurements with artificial networks. With the ESA1 tools disturbance sources can be localized, effects can be detected, and EMC measures individually determined. The effects of improvements implemented by ESA1 are proportional to the results from far-field measurements. ESA1 is designed for use at the developer’s working place.

Further reading

Enhance Your EMC Testing with ESA1 – Featuring the Powerful CS-ESA Software for Comparable and well-documented emission measurements Leverage the advanced capabilities of CS-ESA software to quickly identify, analyze, and mitigate interference, ensuring your devices reach EMC standards efficiently and effectively.

Enhance Your EMC Testing with ESA1 – Featuring the Powerful CS-ESA Software for Comparable and well-documented emission measurements Leverage the advanced capabilities of CS-ESA software to quickly identify, analyze, and mitigate interference, ensuring your devices reach EMC standards efficiently and effectively.

Master EMC Compliance with ESA1 – Featuring Precision Near-Field Probes for Accurate Interference Localization! Utilize our high-sensitivity near-field probes to detect and mitigate interference sources right at your workstation.

Pinpoint and Eliminate Interference Early with ESA1 – Precision at Your Workspace!

handy emitted interference test station for the developer's workstation - ESA1 development system for measuring emitted interference at the developer's workstation

Near-field probes from Langer EMV-Technik GmbH in proven high quality and precision for 30 years - manufactured in Germany

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